Atomic Force Microscopy (AFM)
Force Microscopy is combined with the Piezoresponse Force Microscopy (Electronic Response of Materials) and Magnetic force microscope (Magnetic Response of Materials.
Contact Person
- Prof. Ashish Garg
Research:
Materials science, Life science, Polymers, Nanolithography, Electrical/magnetic measurements and Nanoindenting.Location Info:
WL - 104Timings:
10.00 AM to 01.00 PM 02.00 PM to 05.00 PMContact info:
Material Science & Engineering
Indian Institute of Technology, Kanpur 208016
Tel: +91 - (0)512 - 2597904, 2597263
Fax: +91- (0)512 - 2597505 or 2596621
Email: [email protected]
Office: WL-104