Purchase of a specialized scanning force microscope with PFM/MFM/EFM capabilities
5109
Tender No.:MSE/MK /2012-13 /65
Department of Materials Science and Engineering
03/04/2013
18/03/2013
Low voltage source meter
5110
Tender No.:ACMS/ AU/ 2012-13/ E-1
Advanced Center for Materials Science
03/06/2013
18/03/2013
Quotation for Mechanical Testing system
5111
Tender No.:ACMS/ AU/ 2012-13/ E-2
Advanced Center for Materials Science
03/06/2013
18/03/2013
Quotation for Instrumented microhardness tester
5112
Tender No.:ACMS/ AU/ 2012-13/ E-3
Advanced Center for Materials Science
03/06/2013
18/03/2013
Quotation for E3. High resolution X-ray diffractometer
5113
Tender No.:ACMS/ AU/ 2012-13/ E-4
Advanced Center for Materials Science
03/06/2013
18/03/2013
Quotation for XRD with Curved Position Sensitive Detector
5114
Tender No.:ACMS/ AU/ 2012-13/ E-5
*Revised
Advanced Center for Materials Science
03/06/2013
18/03/2013
Quotation for Field-emission-gun based Scanning Electron Microscope (FEG-SEM)
5115
Tender No.:ACMS/ AU/ 2012-13/ E-6
Advanced Center for Materials Science
03/06/2013
18/03/2013
Quotation for Tabletop Scanning Electron Microscope
5116
Tender No.:ACMS/ AU/ 2012-13/ E-7
Advanced Center for Materials Science
03/06/2013
18/03/2013
Quotation for Fully motorized upright research microscope for reflected and transmitted light application with bright field, dark field and DIC(FEG-SEM)
5117
Tender No.:ACMS/ AU/ 2012-13/ E-8
Advanced Center for Materials Science
03/06/2013
18/03/2013
Quotation for spark/arc type Optical Emission Spectrometer (OES)
5118
Tender No.:ACMS/ AU/ 2012-13/ E-9
Advanced Center for Materials Science
03/06/2013
18/03/2013
Quotation for Thermal measurement system consisting of Differential Scanning Calorimetry (DSC), Differential Thermal Analysis (DTA) and Thermo-gravimetric Analysis